SEM and TEM Analysis
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The NanoFab enjoys easy access to 杏吧原创 Nano Imaging Facility (NIF) and characterization of samples can be incorporated into projects without requiring any additional effort on your part.
The NIF is home to two state-of-the-art Electron Microscopes: a Tescan VegaII XMU SEM and an FEI Tecnai G2 TEM. Each have EDX capability. Please see the NIF website, linked above, for more details.